Ouyang, X.; Zhang, S.; Bai, T.; Chen, Z.; Deng, Y.; Zhou, L.; Song, X.; Chen, H.; Lai, Y.; Lu, X.;
et al. Performance Degradation of Ga2O3-Based X-Ray Detector Under Gamma-Ray Irradiation. Micromachines 2025, 16, 339.
https://doi.org/10.3390/mi16030339
AMA Style
Ouyang X, Zhang S, Bai T, Chen Z, Deng Y, Zhou L, Song X, Chen H, Lai Y, Lu X,
et al. Performance Degradation of Ga2O3-Based X-Ray Detector Under Gamma-Ray Irradiation. Micromachines. 2025; 16(3):339.
https://doi.org/10.3390/mi16030339
Chicago/Turabian Style
Ouyang, Xiao, Silong Zhang, Tao Bai, Zhuo Chen, Yuxin Deng, Leidang Zhou, Xiaojing Song, Hao Chen, Yuru Lai, Xing Lu,
and et al. 2025. "Performance Degradation of Ga2O3-Based X-Ray Detector Under Gamma-Ray Irradiation" Micromachines 16, no. 3: 339.
https://doi.org/10.3390/mi16030339
APA Style
Ouyang, X., Zhang, S., Bai, T., Chen, Z., Deng, Y., Zhou, L., Song, X., Chen, H., Lai, Y., Lu, X., Chen, L., Miao, L., & Ouyang, X.
(2025). Performance Degradation of Ga2O3-Based X-Ray Detector Under Gamma-Ray Irradiation. Micromachines, 16(3), 339.
https://doi.org/10.3390/mi16030339
