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Journal: Micromachines, 2025
Volume: 16
Number: 116
116
Article: An All-in-One Testing Chip for the Simultaneous Measurement of Multiple Thermoelectric Parameters in Doped Polysilicon
Authors: by Lei Shi, Na Zhou, Jintao Wu, Meng Shi, Yizhi Shi, Cheng Lei and Haiyang Mao
Link: https://www.mdpi.com/2072-666X/16/2/116

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