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Journal: Micromachines, 2025
Volume: 16
Number: 1393

Article: Mobility of Carriers in Strong Inversion Layers Associated with Threshold Voltage for Gated Transistors
Authors: by Hsin-Chia Yang, Sung-Ching Chi, Bo-Hao Huang, Tung-Cheng Lai and Han-Ya Yang
Link: https://www.mdpi.com/2072-666X/16/12/1393

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