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Journal: Micromachines, 2025
Volume: 16
Number: 1260

Article: Gate Metal Defect Screening at Wafer-Level for Improvement of HTGB in Power GaN HEMT
Authors: by Yu-Ting Chuang and Niall Tumilty
Link: https://www.mdpi.com/2072-666X/16/11/1260

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