Next Article in Journal
TiO2 Nanotube-Enabled Glucose Biosensing: Transformative Insights from 2009 to 2024
Previous Article in Journal
Improve Intermetal Dielectric Process for HTRB Stability in Power GaN High Electron Mobility Transistor (HEMT) by ultra-Highly Accelerated Stress Testing (uHAST)
Previous Article in Special Issue
A Three-Terminal Si-Ge Avalanche Photodiode with a Breakdown Voltage of 6.8 V and a Gain Bandwidth Product of 1377 GHz
 
 
Article

Article Versions Notes

Micromachines 2025, 16(11), 1234; https://doi.org/10.3390/mi16111234
Action Date Notes Link
article xml file uploaded 30 October 2025 10:59 CET Original file -
article xml uploaded. 30 October 2025 10:59 CET Update https://www.mdpi.com/2072-666X/16/11/1234/xml
article pdf uploaded. 30 October 2025 10:59 CET Version of Record https://www.mdpi.com/2072-666X/16/11/1234/pdf
article html file updated 30 October 2025 11:01 CET Original file https://www.mdpi.com/2072-666X/16/11/1234/html
Back to TopTop