Correction: Wang et al. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085
1. Errors in Figures 2–4
2. Text Correction
Reference
- Wang, L.; Jiang, L.; Ma, N.; Huang, X. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085. [Google Scholar] [CrossRef] [PubMed]
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Wang, L.; Jiang, L.; Ma, N.; Huang, X. Correction: Wang et al. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085. Micromachines 2025, 16, 1161. https://doi.org/10.3390/mi16101161
Wang L, Jiang L, Ma N, Huang X. Correction: Wang et al. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085. Micromachines. 2025; 16(10):1161. https://doi.org/10.3390/mi16101161
Chicago/Turabian StyleWang, Lifeng, Lili Jiang, Ning Ma, and Xiaodong Huang. 2025. "Correction: Wang et al. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085" Micromachines 16, no. 10: 1161. https://doi.org/10.3390/mi16101161
APA StyleWang, L., Jiang, L., Ma, N., & Huang, X. (2025). Correction: Wang et al. Temperature Effects in Packaged RF MEMS Switches with Optimized Gold Electroplating Process. Micromachines 2024, 15, 1085. Micromachines, 16(10), 1161. https://doi.org/10.3390/mi16101161