Tsai, H.-Y.; Lin, Y.-H.; Huang, K.-C.; Yeh, J.A.; Yang, Y.; Ding, C.-F.
A Comparative Analysis of Laser-Ablated Surface Characteristics Between the Si Face and C Face of Silicon Carbide Substrates. Micromachines 2025, 16, 62.
https://doi.org/10.3390/mi16010062
AMA Style
Tsai H-Y, Lin Y-H, Huang K-C, Yeh JA, Yang Y, Ding C-F.
A Comparative Analysis of Laser-Ablated Surface Characteristics Between the Si Face and C Face of Silicon Carbide Substrates. Micromachines. 2025; 16(1):62.
https://doi.org/10.3390/mi16010062
Chicago/Turabian Style
Tsai, Hsin-Yi, Yu-Hsuan Lin, Kuo-Cheng Huang, J. Andrew Yeh, Yi Yang, and Chien-Fang Ding.
2025. "A Comparative Analysis of Laser-Ablated Surface Characteristics Between the Si Face and C Face of Silicon Carbide Substrates" Micromachines 16, no. 1: 62.
https://doi.org/10.3390/mi16010062
APA Style
Tsai, H.-Y., Lin, Y.-H., Huang, K.-C., Yeh, J. A., Yang, Y., & Ding, C.-F.
(2025). A Comparative Analysis of Laser-Ablated Surface Characteristics Between the Si Face and C Face of Silicon Carbide Substrates. Micromachines, 16(1), 62.
https://doi.org/10.3390/mi16010062