Article Versions Notes

Zhu Y, Cheng Y, Gao H, Sun S, Zhang X, Xue L, Tang J, Tang Y. High-Precision Measurement of Microscales Based on Optoelectronics and Image Integration Method. Micromachines. 2024; 15(9):1162. https://doi.org/10.3390/mi15091162

Zhu, Yanlong, Yinbao Cheng, Hongtang Gao, Shuanghua Sun, Xudong Zhang, Liang Xue, Jiangwen Tang, and Yingqi Tang. 2024. "High-Precision Measurement of Microscales Based on Optoelectronics and Image Integration Method" Micromachines 15, no. 9: 1162. https://doi.org/10.3390/mi15091162

Zhu, Y., Cheng, Y., Gao, H., Sun, S., Zhang, X., Xue, L., Tang, J., & Tang, Y. (2024). High-Precision Measurement of Microscales Based on Optoelectronics and Image Integration Method. Micromachines, 15(9), 1162. https://doi.org/10.3390/mi15091162