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Journal: Micromachines, 2024
Volume: 15
Number: 954
Article:
A Comparative Study of Methods for Calculating the Dislocation Density in GaN-on-Si Epitaxial Wafers
Authors:
by
Yujie Yan, Jun Huang, Lei Pan, Biao Meng, Qiangmin Wei and Bing Yang
Link:
https://www.mdpi.com/2072-666X/15/8/954
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