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Journal: Micromachines, 2024
Volume: 15
Number: 954

Article: A Comparative Study of Methods for Calculating the Dislocation Density in GaN-on-Si Epitaxial Wafers
Authors: by Yujie Yan, Jun Huang, Lei Pan, Biao Meng, Qiangmin Wei and Bing Yang
Link: https://www.mdpi.com/2072-666X/15/8/954

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