Yu, H.; Zhou, W.; Liu, H.; Wang, S.; Chen, S.; Liu, C.
Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines 2024, 15, 1026.
https://doi.org/10.3390/mi15081026
AMA Style
Yu H, Zhou W, Liu H, Wang S, Chen S, Liu C.
Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines. 2024; 15(8):1026.
https://doi.org/10.3390/mi15081026
Chicago/Turabian Style
Yu, Hao, Wei Zhou, Hongxia Liu, Shulong Wang, Shupeng Chen, and Chang Liu.
2024. "Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices" Micromachines 15, no. 8: 1026.
https://doi.org/10.3390/mi15081026
APA Style
Yu, H., Zhou, W., Liu, H., Wang, S., Chen, S., & Liu, C.
(2024). Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines, 15(8), 1026.
https://doi.org/10.3390/mi15081026