Yu, H.;                     Zhou, W.;                     Liu, H.;                     Wang, S.;                     Chen, S.;                     Liu, C.    
        Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines 2024, 15, 1026.
    https://doi.org/10.3390/mi15081026
    AMA Style
    
                                Yu H,                                 Zhou W,                                 Liu H,                                 Wang S,                                 Chen S,                                 Liu C.        
                Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines. 2024; 15(8):1026.
        https://doi.org/10.3390/mi15081026
    
    Chicago/Turabian Style
    
                                Yu, Hao,                                 Wei Zhou,                                 Hongxia Liu,                                 Shulong Wang,                                 Shupeng Chen,                                 and Chang Liu.        
                2024. "Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices" Micromachines 15, no. 8: 1026.
        https://doi.org/10.3390/mi15081026
    
    APA Style
    
                                Yu, H.,                                 Zhou, W.,                                 Liu, H.,                                 Wang, S.,                                 Chen, S.,                                 & Liu, C.        
        
        (2024). Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. Micromachines, 15(8), 1026.
        https://doi.org/10.3390/mi15081026