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Journal: MicromachinesVolume: 15Number: 1005
Article: A CMOS-Compatible Process for ≥3 kV GaN Power HEMTs on 6-inch Sapphire Using In Situ SiN as the Gate Dielectric
  • Authors:
  • Jie Zhang1,
  • Xiangdong Li1,2,* and
  • Jian Ji1
  • et al.
Link: https://www.mdpi.com/2072-666X/15/8/1005

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