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Journal: Micromachines, 2024
Volume: 15
Number: 726
726
Article: Reducing Off-State and Leakage Currents by Dielectric Permittivity-Graded Stacked Gate Oxides on Trigate FinFETs: A TCAD Study
Authors: by Alper Ülkü, Esin Uçar, Ramis Berkay Serin, Rifat Kaçar, Murat Artuç, Ebru Menşur and Ahmet Yavuz Oral
Link: https://www.mdpi.com/2072-666X/15/6/726

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