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Journal: Micromachines, 2024
Volume: 15
Number: 541
Article:
A Method for Automatically Predicting the Radiation-Induced Vulnerability of Unit Integrated Circuits
Authors:
by
Rui Dong, Hongliang Lu, Caozhen Yang, Yutao Zhang, Ruxue Yao, Yujian Wang and Yuming Zhang
Link:
https://www.mdpi.com/2072-666X/15/4/541
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