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Journal: Micromachines, 2024
Volume: 15
Number: 1465
1465
Article: Application of Solution-Processed High-Entropy Metal Oxide Dielectric Layers with High Dielectric Constant and Wide Bandgap in Thin-Film Transistors
Authors: by Jun Liu, Xin Xiong, Han Li, Xiangchen Huang, Yajun Wang, Yifa Sheng, Zhihao Liang, Rihui Yao, Honglong Ning and Xiaoqin Wei
Link: https://www.mdpi.com/2072-666X/15/12/1465

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