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Journal: Micromachines, 2024
Volume: 15
Number: 127
Article:
The Understanding and Compact Modeling of Reliability in Modern Metal–Oxide–Semiconductor Field-Effect Transistors: From Single-Mode to Mixed-Mode Mechanisms
Authors:
by
Zixuan Sun, Sihao Chen, Lining Zhang, Ru Huang and Runsheng Wang
Link:
https://www.mdpi.com/2072-666X/15/1/127
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