Article Versions Notes

Do H-B, Luc Q-H, Pham PV, Phan-Gia A-V, Nguyen T-S, Le H-M, De Souza MM. Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO₂/InGaAs. Micromachines. 2023; 14(8):1606. https://doi.org/10.3390/mi14081606

Do, Huy-Binh, Quang-Ho Luc, Phuong V. Pham, Anh-Vu Phan-Gia, Thanh-Son Nguyen, Hoang-Minh Le, and Maria Merlyne De Souza. 2023. "Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO₂/InGaAs" Micromachines 14, no. 8: 1606. https://doi.org/10.3390/mi14081606

Do, H.-B., Luc, Q.-H., Pham, P. V., Phan-Gia, A.-V., Nguyen, T.-S., Le, H.-M., & De Souza, M. M. (2023). Metal-Induced Trap States: The Roles of Interface and Border Traps in HfO₂/InGaAs. Micromachines, 14(8), 1606. https://doi.org/10.3390/mi14081606