Hadámek, T.; Jørstad, N.P.; de Orio, R.L.; Goes, W.; Selberherr, S.; Sverdlov, V.
A Comprehensive Study of Temperature and Its Effects in SOT-MRAM Devices. Micromachines 2023, 14, 1581.
https://doi.org/10.3390/mi14081581
AMA Style
Hadámek T, Jørstad NP, de Orio RL, Goes W, Selberherr S, Sverdlov V.
A Comprehensive Study of Temperature and Its Effects in SOT-MRAM Devices. Micromachines. 2023; 14(8):1581.
https://doi.org/10.3390/mi14081581
Chicago/Turabian Style
Hadámek, Tomáš, Nils Petter Jørstad, Roberto Lacerda de Orio, Wolfgang Goes, Siegfried Selberherr, and Viktor Sverdlov.
2023. "A Comprehensive Study of Temperature and Its Effects in SOT-MRAM Devices" Micromachines 14, no. 8: 1581.
https://doi.org/10.3390/mi14081581
APA Style
Hadámek, T., Jørstad, N. P., de Orio, R. L., Goes, W., Selberherr, S., & Sverdlov, V.
(2023). A Comprehensive Study of Temperature and Its Effects in SOT-MRAM Devices. Micromachines, 14(8), 1581.
https://doi.org/10.3390/mi14081581