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Prediction of Device Characteristics of Feedback Field-Effect Transistors Using TCAD-Augmented Machine Learning
 
 

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Journal: Micromachines, 2023
Volume: 14
Number: 1138

Article: Disturbance Characteristics of 1T DRAM Arrays Consisting of Feedback Field-Effect Transistors
Authors: by Juhee Jeon, Kyoungah Cho and Sangsig Kim
Link: https://www.mdpi.com/2072-666X/14/6/1138

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