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Journal: Micromachines, 2023
Volume: 14
Number: 1090

Article: Performance Degradation in Static Random Access Memory of 10 nm Node FinFET Owing to Displacement Defects
Authors: by Minji Bang, Jonghyeon Ha, Gyeongyeop Lee, Minki Suh and Jungsik Kim
Link: https://www.mdpi.com/2072-666X/14/5/1090

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