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Journal: Micromachines, 2023
Volume: 14
Number: 672
Article:
Modeling and Simulation Investigation of Ferroelectric-Based Electrostatic Doping for Tunnelling Field-Effect Transistor
Authors:
by
Dong Wang, Hongxia Liu, Hao Zhang, Ming Cai and Jinfu Lin
Link:
https://www.mdpi.com/2072-666X/14/3/672
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