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Journal: Micromachines, 2023
Volume: 14
Number: 576

Article: Improving the High-Temperature Gate Bias Instabilities by a Low Thermal Budget Gate-First Process in p-GaN Gate HEMTs
Authors: by Catherine Langpoklakpam, An-Chen Liu, Neng-Jie You, Ming-Hsuan Kao, Wen-Hsien Huang, Chang-Hong Shen, Jerry Tzou, Hao-Chung Kuo and Jia-Min Shieh
Link: https://www.mdpi.com/2072-666X/14/3/576

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