Zhang, Y.; Lu, H.; Liu, C.; Zhang, Y.; Yao, R.; Liu, X.
An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines 2023, 14, 2085.
https://doi.org/10.3390/mi14112085
AMA Style
Zhang Y, Lu H, Liu C, Zhang Y, Yao R, Liu X.
An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines. 2023; 14(11):2085.
https://doi.org/10.3390/mi14112085
Chicago/Turabian Style
Zhang, Yutao, Hongliang Lu, Chen Liu, Yuming Zhang, Ruxue Yao, and Xingming Liu.
2023. "An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor" Micromachines 14, no. 11: 2085.
https://doi.org/10.3390/mi14112085
APA Style
Zhang, Y., Lu, H., Liu, C., Zhang, Y., Yao, R., & Liu, X.
(2023). An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines, 14(11), 2085.
https://doi.org/10.3390/mi14112085