Zhang, Y.;                     Lu, H.;                     Liu, C.;                     Zhang, Y.;                     Yao, R.;                     Liu, X.    
        An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines 2023, 14, 2085.
    https://doi.org/10.3390/mi14112085
    AMA Style
    
                                Zhang Y,                                 Lu H,                                 Liu C,                                 Zhang Y,                                 Yao R,                                 Liu X.        
                An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines. 2023; 14(11):2085.
        https://doi.org/10.3390/mi14112085
    
    Chicago/Turabian Style
    
                                Zhang, Yutao,                                 Hongliang Lu,                                 Chen Liu,                                 Yuming Zhang,                                 Ruxue Yao,                                 and Xingming Liu.        
                2023. "An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor" Micromachines 14, no. 11: 2085.
        https://doi.org/10.3390/mi14112085
    
    APA Style
    
                                Zhang, Y.,                                 Lu, H.,                                 Liu, C.,                                 Zhang, Y.,                                 Yao, R.,                                 & Liu, X.        
        
        (2023). An Improved Model of Single-Event Transients Based on Effective Space Charge for Metal–Oxide–Semiconductor Field-Effect Transistor. Micromachines, 14(11), 2085.
        https://doi.org/10.3390/mi14112085