Article Versions Notes

Tyaginov S, Bury E, Grill A, Yu Z, Makarov A, De Keersgieter A, Vexler M, Vandemaele M, Wang R, Spessot A, et al. Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range. Micromachines. 2023; 14(11):2018. https://doi.org/10.3390/mi14112018

Tyaginov, Stanislav, Erik Bury, Alexander Grill, Zhuoqing Yu, Alexander Makarov, An De Keersgieter, Mikhail Vexler, Michiel Vandemaele, Runsheng Wang, Alessio Spessot, and et al. 2023. "Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range" Micromachines 14, no. 11: 2018. https://doi.org/10.3390/mi14112018

Tyaginov, S., Bury, E., Grill, A., Yu, Z., Makarov, A., De Keersgieter, A., Vexler, M., Vandemaele, M., Wang, R., Spessot, A., Chasin, A., & Kaczer, B. (2023). Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range. Micromachines, 14(11), 2018. https://doi.org/10.3390/mi14112018