Zhang, D.; Yang, H.; Cao, Y.; Han, Z.; Liu, Y.; Wu, Q.; Han, Y.; Jiang, H.; Yang, J.
Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance Calibration Circuits. Micromachines 2023, 14, 1851.
https://doi.org/10.3390/mi14101851
AMA Style
Zhang D, Yang H, Cao Y, Han Z, Liu Y, Wu Q, Han Y, Jiang H, Yang J.
Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance Calibration Circuits. Micromachines. 2023; 14(10):1851.
https://doi.org/10.3390/mi14101851
Chicago/Turabian Style
Zhang, Donglin, Honghu Yang, Yue Cao, Zhongze Han, Yixuan Liu, Qiqiao Wu, Yongkang Han, Haijun Jiang, and Jianguo Yang.
2023. "Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance Calibration Circuits" Micromachines 14, no. 10: 1851.
https://doi.org/10.3390/mi14101851
APA Style
Zhang, D., Yang, H., Cao, Y., Han, Z., Liu, Y., Wu, Q., Han, Y., Jiang, H., & Yang, J.
(2023). Methodology for Testing Key Parameters of Array-Level Small-Area Hafnium-Based Ferroelectric Capacitors Using Time-to-Digital Converter and Capacitance Calibration Circuits. Micromachines, 14(10), 1851.
https://doi.org/10.3390/mi14101851
