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Journal: Micromachines, 2022
Volume: 13
Number: 1096

Article: Evaluation on Temperature-Dependent Transient VT Instability in p-GaN Gate HEMTs under Negative Gate Stress by Fast Sweeping Characterization
Authors: by Rui Wang, Hui Guo, Qianyu Hou, Jianming Lei, Jin Wang, Junjun Xue, Bin Liu, Dunjun Chen, Hai Lu, Rong Zhang and Youdou Zheng
Link: https://www.mdpi.com/2072-666X/13/7/1096

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