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Journal: Micromachines, 2022
Volume: 13
Number: 84

Article: Comprehensive Schottky Barrier Height Behavior and Reliability Instability with Ni/Au and Pt/Ti/Pt/Au on AlGaN/GaN High-Electron-Mobility Transistors
Authors: by Surajit Chakraborty and Tae-Woo Kim
Link: https://www.mdpi.com/2072-666X/13/1/84

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