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Journal: Micromachines, 2022
Volume: 13
Number: 35
35
Article: Single-Wedge Lift-Out for Atom Probe Tomography Al/Ni Multilayers Specimen Preparation Based on Dual-Beam-FIB
Authors: by Yi Qiao, Yalong Zhao, Zheng Zhang, Binbin Liu, Fusheng Li, Huan Tong, Jintong Wu, Zhanqi Zhou, Zongwei Xu and Yue Zhang
Link: https://www.mdpi.com/2072-666X/13/1/35

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