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Journal: Micromachines, 2022
Volume: 13
Number: 124

Article: Power Reduction in Punch-Through Current-Based Electro-Thermal Annealing in Gate-All-Around FETs
Authors: by Min-Kyeong Kim, Yang-Kyu Choi and Jun-Young Park
Link: https://www.mdpi.com/2072-666X/13/1/124

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