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Journal: Micromachines, 2021
Volume: 12
Number: 2
Article:
Channel Shape Effects on Device Instability of Amorphous Indium–Gallium–Zinc Oxide Thin Film Transistors
Authors:
by
Seung Gi Seo, Seung Jae Yu, Seung Yeob Kim, Jinheon Jeong and Sung Hun Jin
Link:
https://www.mdpi.com/2072-666X/12/1/2
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