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Journal: Micromachines, 2021
Volume: 12
Number: 2

Article: Channel Shape Effects on Device Instability of Amorphous Indium–Gallium–Zinc Oxide Thin Film Transistors
Authors: by Seung Gi Seo, Seung Jae Yu, Seung Yeob Kim, Jinheon Jeong and Sung Hun Jin
Link: https://www.mdpi.com/2072-666X/12/1/2

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