1. Introduction
The Landsat satellite program is the longest contiguous Earth-observing program. It started in 1972 with medium-resolution land imaging top-of-atmosphere (TOA) products. These images are used to monitor Earth’s surface changes both locally and globally. In 2017, the U.S. Geological Survey (USGS) upgraded the archive to include a surface reflectance product in addition to the TOA products previously available to assist users in their Earth monitoring pursuits. These products are available on Earth Explorer and require variable processing times depending on the product [
1]. Surface reflectance is derived using the TOA product after correction for the temporally, spatially, and spectrally varying scattering and absorbing effects of atmospheric gasses and aerosol [
2]. Surface reflectance is necessary for the reliable study of Earth’s surface changes as the atmospheric effect is minimized. For this reason, most global land products from Moderate Resolution Imaging Spectrometer (MODIS) and Visible Infrared Imaging Radiometer Suite (VIIRS) sensors used surface reflectance products instead of TOA products.
Accurate and precise surface reflectance measurement is vital in satellite sensor calibration and validating satellite-derived products. Surface reflectance measurement is predominantly used for two purposes: (i) reflectance-based vicarious calibration and (ii) validation of satellite-derived TOA and surface reflectance products [
3,
4,
5]. The reflectance-based vicarious calibration/validation approach measures surface reflectance and atmospheric parameters such as aerosol and water vapor during satellite overpass. These measurements are input to a radiative transfer code to model the atmosphere during satellite overpass and predict TOA reflectance. The predicted TOA reflectance is compared with the corresponding satellite digital number to derive radiometric calibration gain and bias for satellite sensor calibration, or it is compared with satellite TOA reflectance to validate the satellite TOA reflectance product. Similarly, surface reflectance during a satellite overpass is compared with the satellite-derived surface reflectance product to validate product accuracy. Satellite sensors and their product’s radiometric quality have been increasing with technological advancements. Thus, surface reflectance measurement is also expected to be improved to calibrate and validate such high-quality sensors and their products.
Typically, surface reflectance is measured by conducting a field campaign during sensor overpass. This approach has been used to calibrate and validate different types of satellite sensors and their products [
3,
4,
5,
6,
7]. Two major pieces of equipment used during a field campaign for measuring a target are a spectrometer and a reference calibration panel. A spectrometer is used to measure reflected energy from the target and the reference calibration panel. The reference panel is sampled approximately every 5 min, which is commonly practiced during field campaigns to measure surface reflectance for validation and calibration of optical satellite sensors and their products [
8]. Target reflectance is calculated using the ratio of upwelling radiance from the target and downwelling solar irradiance during the target measurement. Such measurement allows for a traceable knowledge of the absolute accuracy of the measurement. However, it is a labor-intensive and expensive process; thus, only a few campaigns have been carried out, yielding a low-frequency data collection [
9]. To mitigate its shortcomings, RadCalNet, the Radiometric Calibration Network, has been developed by the Infrared Visible Optical Sensors (IVOS) subgroup of the Committee on Earth Observation Satellites (CEOS) Working Group on Calibration and Validation (WGCV). RadCalNet is an automated instrumentation developed to measure surface reflectance operationally over several selected sites [
10]. The ground viewing radiometer (GVR) at Railroad Valley Playa and the spectrometer at Baotou measure the surface every two minutes [
10]. Satellite TOA and surface products have been validated by comparing them with RadCalNet measurements [
4,
5,
11].
A major limitation of the current approach to estimating surface reflectance is its inability to track atmospheric transmittance changes during the measurement of the unknown target and to take it into account while estimating its reflectance. This issue can be addressed using the dual-spectrometer approach. In the dual-spectrometer approach, the stationary spectrometer stares at the reference calibration panel and tracks changes in atmospheric transmittance, while the mobile spectrometer measures the unknown target. These simultaneous measurements are used to track changes in the atmosphere continuously and then to update the reflectance calibration of the mobile unit continuously during the time it was collecting upwelling radiance from the target by synchronizing the measurements. This synchronization tracks changes in atmospheric transmittance and reduces variability during surface reflectance measurement of the unknown target. The objective of this paper is to report a methodology that improves surface reflectance precision using the dual-spectrometer approach. Preliminary results have shown that the dual-spectrometer approach can estimate the surface reflectance of an unknown target more precisely than the single-spectrometer approach.
This paper is organized as follows:
Section 2 describes the equipment used in the field campaign and the methodology used to collect and process the field data.
Section 3 compares the surface reflectance from the single- and dual-spectrometer approaches.
Section 4 discusses the reason for more precise surface reflectance estimation using the dual-spectrometer approach. Finally,
Section 5 presents the conclusion of this work.
4. Discussion
Based on the results presented in
Section 3, this section discusses a comparison between the surface reflectance estimated using the dual- and single-spectrometer approaches in two scenarios: (1) a clear sky where improvement using the dual-spectrometer approach over the single-spectrometer approach is minimal and one in which (2) the sky changes rapidly where the dual-spectrometer approach estimated the surface reflectance more precisely than the single-spectrometer approach. This section also discusses the condition when the dual system could not compensate for atmospheric changes correctly.
The surface reflectance of a target using the single- and dual-spectrometer approaches is very similar during clear days when atmospheric transmittance is the same during target measurement.
Figure 20 shows downwelling irradiance measured by the MU and FBU, represented by the red symbols and blue curve, respectively, at Coconino National Forest in Arizona on 15 November 2021 (10:42 AM). Green symbols represent predicted downwelling irradiance calculated by linearly interpolating MU’s consecutive downwelling irradiance measurements using a 99A calibration panel. Downwelling irradiance measured by MU and FBU and the predicted irradiance are similar during clear sky conditions. Even on such a ‘perfect’ day where the atmospheric condition is optimal, there is noticeable variability tracked by the FBU that the MU cannot measure. The unique ability of the dual-spectrometer approach to continuously track atmospheric changes and utilize it for estimating the surface reflectance improved the precision of the target surface reflectance compared to the single-spectrometer approach. The bias is noticeable between the downwelling solar irradiance measured by the MU and FBU. This bias is attributed to discrepancies in the BRFs of two panels, spectrometers, and data collection procedures. This leads to a discrepancy in the mean surface reflectance of the target, as shown in
Figure 16 and
Figure 19; however, it does not impact the precision of the surface reflectance of the target.
Figure 21 shows the change in MU reflectance calibration gain as a function of time using the dual approach. Only visible and near-infrared regions are shown in the figure due to scaling issues. MU reflectance calibration gain decreases linearly as a function of time, as shown in
Figure 21, as downwelling irradiance increases linearly temporally. The dual approach uses the simultaneous measurement of the calibration panel to track changes in the atmosphere continuously and use them to update the reflectance calibration of the mobile unit continuously during the time it was collecting upwelling radiance from the target. However, a single approach uses periodic sampling of the calibration panel to obtain reflectance calibration gain.
Figure 22 compares the MU reflectance calibration gain of the 865 nm channel calculated using the single and dual approaches, as shown by blue and magenta curves, respectively. Both approaches show reflectance calibration gain decreases from approximately 6.5 to 6.0 from the start to the end of the target measurement. The calibration gain obtained from the dual-spectrometer approach captures the subtle variation of atmospheric transmittance changes, but the gain from the single-spectrometer approach could not capture the variation. The bias in the reflectance calibration curves is due to the discrepancy in BRFs of two panels, spectrometers, and data collection procedure and ranges up to 1.5%, as shown by the green curve in
Figure 22.
Figure 23 compares surface reflectance at 865 nm from the single- and dual-spectrometer approaches. The blue and magenta symbols represent surface reflectance from the single- and dual-spectrometer approaches. Surface reflectance and its variation from both approaches are similar due to minimal changes in atmospheric transmittance as downwelling irradiance (shown by the green curve in
Figure 23) changes reasonably linearly with small fluctuations during target measurement. However, surface reflectance from the single approach is overestimated as MU reflectance calibration gain is overestimated by 1–2% for the majority of spectral regions due to the bias between two independent calibration methods, as shown in
Figure 24. Further research is being carried out to understand the source of the bias and mitigate it.
Figure 25 shows surface reflectance comparison using the single- and dual-spectrometer approaches. It shows an improvement in the precision of surface reflectance using the dual-spectrometer approach, even during optimal atmospheric conditions. The black and blue curves represent the standard deviation of the target surface reflectance using the single- and dual-spectrometer approaches, respectively. The target surface reflectance precision improved by 2% across the majority of spectral regions and more than 6% beyond 1950 nm, as shown by the red curve in
Figure 25.
Figure 26 shows downwelling radiance measurements when atmospheric transmittance changes rapidly during target measurements. The blue curve and red symbols show downwelling irradiance measured by the FBU and MU. Similarly, the green symbols represent downwelling irradiance predicted using the MU periodic sampling of the 99A calibration panel. As atmospheric transmittance changes rapidly, predicted downwelling irradiance is not sufficient to estimate downwelling irradiance properly. Predicted downwelling irradiance either underestimates or overestimates the real measurement, as shown in
Figure 26. Predicted downwelling irradiance is underestimated at approximately 40,100 s; downwelling radiance is predicted as ~0.12 radiance units, whereas actual downwelling irradiance measurement is ~0.17 radiance units. Similarly, the predicted downwelling irradiance is overestimated at approximately 40,600 s; downwelling irradiance is predicted as ~0.145 radiance units, whereas the real measurement is less than ~0.08 radiance units. These discrepancies result in a large difference between the surface reflectance precision estimated using the two approaches.
Figure 27 shows MU reflectance calibration gain change using the dual-spectrometer approach during target measurement, and different colors correspond to different wavelengths from the VNIR spectral region. The MU reflectance calibration gains across all the wavelength changes rapidly due to atmospheric transmittance fluctuation during target measurements.
Figure 28 compares the MU calibration gain for 865 nm using the two approaches. The blue and magenta curves represent MU reflectance gain using the single- and dual-spectrometer approaches, respectively. Even though the MU reflectance calibration gain using the dual-spectrometer approach fluctuates, the calibration gain using the single-spectrometer approach does not change as this approach uses predicted downwelling irradiance calculated from periodic sampling from the 99A calibration panel. The MU reflectance gain using the dual spectrometer ranges from 5 to 20, but the gain ranges from only 6 to 9 using the single-spectrometer approach, as shown in
Figure 28. Such discrepancy in the MU reflectance calibration gain is due to either underestimation or overestimation of downwelling solar irradiance from the single-spectrometer approach.
MU reflectance calibration gain from the two approaches only agrees briefly at approximately 41,300 s when predicted, and actual downwelling irradiance is close to each other, as shown in
Figure 28. The gain from these approaches differs up to 40% at approximately 40,100 and 40,900 s, as shown by the green curve in
Figure 28. This amount of discrepancy in MU reflectance calibration gain using the single-spectrometer approach is due to a lack of simultaneous panel and target measurements.
Discrepancy in the MU reflectance calibration gain results in different surface reflectance of the target, as shown in
Figure 29. The surface reflectance of the target from single and dual approaches is represented by blue and magenta symbols, whereas the green curve represents the FBU radiance measurements. During higher atmospheric transmittance, at approximately 40,100 s, the MU reflectance calibration gain using the single-spectrometer approach is overestimated compared to the dual-spectrometer approach, as shown in
Figure 28. As a result, the average surface reflectance of the target at 865 nm using the single-spectrometer approach is overestimated as ~0.35, whereas from the dual-spectrometer approach, it is estimated as ~0.25. During lower atmospheric transmittance, at approximately 40,550 s, the MU reflectance calibration gain using the single-spectrometer approach is underestimated compared to the dual-spectrometer approach, as shown in
Figure 28. As a result, the average surface reflectance of the target from the single-spectrometer approach is underestimated as ~0.15, whereas it is estimated as ~0.25 using the dual-spectrometer approach. A similar analysis has been presented for coastal sites, and the result shows that under sub-optimal sky conditions, the reflectance of sand measured using the single-spectrometer approach underestimates the true reflectance by as much as 20% [
21].
Figure 30 shows a substantial improvement in the precision of surface reflectance using the dual-spectrometer approach during non-optimal atmospheric conditions. The black and blue curves represent the standard deviation of the target surface reflectance using the single- and dual-spectrometer approaches, respectively. The target surface reflectance precision improved by at least 50% across most spectral regions, as shown by the red curve in
Figure 30. The surface reflectance of the target using the dual-spectrometer approach is more precise than the single-spectrometer approach. The dual-spectrometer approach continuously tracks changes in atmospheric transmittance and adjusts MU reflectance calibration gain. This adjusted MU reflectance gain helps to calculate the surface reflectance of a target more precisely by taking account of changes in atmospheric transmittance continuously. In contrast, the single-spectrometer approach assumes that the atmosphere is changing linearly and underestimates or overestimates MU reflectance calibration gain as a result of underestimation or overestimation of solar downwelling irradiance. As a result, the target surface reflectance estimate is either overestimated or underestimated, leading to less precision of target surface reflectance.
In the scenario shown in
Figure 29, when there is both over-estimation and underestimation of surface reflectance, on average, surface reflectance estimates are about the same using both the single- and dual-spectrometer approaches. However, in a situation where there was a cloud in front of the Sun for a minute or two, that would result in only a decrease in downwelling irradiance, and the single approach would, therefore, have a substantial bias in it.
The dual-spectrometer approach calculates target reflectance more precisely than the single-spectrometer approach. However, the dual-spectrometer approach struggles to provide accurate surface reflectance of the target when there is a sharp change in atmospheric transmittance, as shown in
Figure 31. The blue curve represents the FBU downwelling irradiance measurements, which dropped sharply at 51,065 seconds during the BigMAC field campaign (31 August, 2:00 PM CDT) at SDSU Research Park, Brookings, South Dakota. To compensate for the sudden decrease in downwelling irradiance, MU reflectance calibration gain spikes, as shown in
Figure 32. Reflectance calibration gains for the wavelengths corresponding to visible near-infrared regions are only shown in
Figure 32 due to scaling issues. The MU reflectance calibration gains for 443 nm, 482 nm, 561 nm, 655 nm, 865 nm, 1609 nm, and 2201 nm are 2.71, 2.43, 2.61, 3.25, 4.58, 19.57, and 56.77, respectively, during the optimal atmospheric condition as shown in
Figure 32. However, during sharp changes in atmospheric transmittance (at 51,065 seconds), the calibration gain spikes to 6.61, 6.54, 8.19, 11.63, 19.07, 109.13, and 556.30, respectively, resulting in higher target surface reflectance than the rest of the spectra as shown in
Figure 11b.
Figure 33 shows a relative change in MU relative reflectance calibration gain. It is calculated by taking a ratio of reflectance calibration gain difference at any time with the initial reflectance calibration gain ((
t))/
. The relative reflectance calibration change is within 5% during the field campaign. However, during the sharp decrease in atmospheric transmittance, its value increases by 145%, 323%, and 903% for 443 nm, 865 nm, and 2201 nm, respectively. This large increase in reflective calibration overestimated target surface reflectance substantially more than the rest of the spectra, as shown in
Figure 11b. The target surface reflectance for 865 nm is approximately 0.28; however, during sharp atmospheric transmittance changes, it is estimated to be 0.4 to 0.8, as shown in
Figure 11b.
The dual-spectrometer approach has a limitation for correctly compensating MU reflectance calibration gain during sudden atmospheric changes. However, it correctly identifies the corrupt spectra and removes them from further analysis, which estimates target surface reflectance more precisely than the single-spectrometer approach.
One possible source of error in spectrometer measurement could be spectrometer dark current drift. Dark current is the current flowing through the detector when there is no incident flux upon the detector [
22,
23]. It is a systematic noise from the instrument electronics and detector and is primarily caused by thermal energy within the sensor. Dark current can be measured and subtracted from all measurements. It is measured by blocking the optics of the spectrometers so that zero illumination strikes the detector. The FieldSpec spectrometer has software for recording and automatically subtracting dark current from all its measurements.
Dark current is relatively constant within a short period of time; however, it changes temporally as internal components and external ambient temperature attempt to reach thermal equilibrium [
14]. So, it is crucial to understand the dark current stability of both spectrometers as a typical field campaign for surface reflectance measurement takes ~30–40 min [
3,
8]. FBU and MU dark currents were recorded by blocking spectrometer optics by its cap for approximately an hour, equivalent to a typical field campaign time. Three sets of experiments were conducted to study dark current drift. Within each set of experiments, dark current was measured for approximately an hour when the spectrometers were exposed to the sunlight and kept in a shadow. The analysis for understanding dark current drift is similar for both spectrometers, so the detailed analysis for FBU (18,844) is only presented in this article. The mean dark current for FBU is shown in
Figure 34a, along with the 1-sigma error bar. The green curve shows the mean dark current when the spectrometer was exposed to sunlight, and the blue curve represents the current when the spectrometer was kept in shadow. In both scenarios, three different levels of dark current were observed for three internal spectrometers. Each spectrometer has three internal spectrometers because of the different quantum efficiency of different detectors [
14,
24]. VNIR spectrometer (350–1000 nm) is made up of a silicon detector, and SWIR 1 (1000–1800 nm) and SWIR 2 (1800–2500 nm) spectrometers are made up of Indium Gallium Arsenide (InGaAs) detector [
14]. The VNIR and SWIR 1 channels have the mean dark current of less than three digital numbers (DNs). The mean dark current for the VNIR channels is similar to the number reported by other researchers [
22]. The mean dark current of the SWIR 2 channels ranges from 70 to 300. SWIR 2 channels are noisy in comparison to VNIR and SWIR 1 channels, as the dark current std for its channels is higher than for VNIR and SWIR 1 channels.
The dark current drift was calculated by fitting the ordinary least square (OLS) to the dark current measurements recorded for an hour, as shown in
Figure 34b. Blue symbols represent temporal dark current measurements at 2201 nm, and the red line represents the fitted OLS line. The significance of the slope of the OLS line is tested using Student’s t-test statistics. A total of 1003 spectral channels of FBU show statistically significant drift, represented by red symbols in
Figure 34c, whereas 1148 channels show statistically insignificant drift, represented by green symbols in
Figure 34c. The spectral channels showing the statistically significant drift are different in different experiments. Among the channels showing statistically significant drift, maximum drift (~0.004 DN/s) was observed in the SWIR2 channels. The change in digital number due to dark current drift within an hour is shown in
Figure 34d. The change is within 1 and 2 DN for VNIR and SWIR 1 channels, respectively. The change ranges from 1 to 19 DN for SWIR 2 channels.
The impact of dark current change in the measured signal is investigated by comparing the change in DN due to dark current drift with the target signal.
Figure 34e shows the DN of the 99% reflective white panel and vegetation in red and green curves, respectively. Relative DN changes with respect to the calibration panel and vegetation signal are shown by red and green symbols, respectively, in
Figure 34f. The impact of dark current change is less than 0.1% for the majority of VNIR and SWIR 1 spectral channels, whereas it is within 1% for SWIR 2 spectral channels as well.
Uncertainty due to dark current changes from all three sets of experiments is well within 0.1% for 350–1800 nm. It is within 0.5% for 1800–2500 nm; however, it is occasionally observed as high as 2.5%.
Sensitivity analysis at the intersection of the internal spectrometers was performed by tracking reflectance change at the intersections for a vegetative surface type. The sensitivity analysis at the VNIR and SWIR 1 intersection is presented in this article. The sensitivity analysis at the SWIR 1 and SWIR 2 intersection is also performed in a similar manner, but results are not presented.
Figure 35a,b show vegetation spectra where a jump in reflectance is observed between 1000 nm and 1001 nm. To further understand and quantify the jump, surface reflectance at 999 nm, 1000 nm, and 1001 nm are plotted as a function of time.
Figure 35c shows surface reflectance at 999 nm and 1000 nm as a function of time. The surface reflectance of adjacent spectral channels within the same VNIR spectrometer lies on top of each other, and the mean surface reflectance difference is 0.09%. However, surface reflectance of adjacent spectral channels from two different spectrometers, 1000 nm (VNIR) and 1001 nm (SWIR 1), are different. Surface reflectance at 1001 nm is either higher or lower than the reflectance at 1000 nm. The mean difference in surface reflectance between these two wavelengths is 2.08%. Similarly, the mean surface reflectance difference between 1799 nm and 1800 nm and 1801 nm and 1800 nm are 0.05% and 3.49%, respectively.
The dual-spectrometer approach, despite its limitation during a sharp change in atmospheric transmittance, has the ability to measure the calibration panel continuously via the FBU and update MU calibration by synchronizing their measurements. This approach tracks any change in atmospheric transmittance continuously and adjusts MU reflectance calibration. As a result, the surface reflectance of the unknown target using the dual spectrometer has higher precision than the single-spectrometer approach.