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Journal: Remote Sens., 2020
Volume: 12
Number: 219
Article:
Coarse-to-Fine Deep Metric Learning for Remote Sensing Image Retrieval
Authors:
by
Min-Sub Yun, Woo-Jeoung Nam and Seong-Whan Lee
Link:
https://www.mdpi.com/2072-4292/12/2/219
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