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Journal: Sustainability, 2026
Volume: 18
Number: 6063
Article:
A New Dependency-Robust Bayesian Network for Assessing Geopolitical Risk’s Impact on Semiconductor Supply Chains
Authors:
by
Zhongzheng Liu, Xiangye Yao and Jinfeng Li
Link:
https://www.mdpi.com/2071-1050/18/12/6063
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