Hu, J.; Jia, R.; Xin, B.; Peng, B.; Wang, Y.; Zhang, Y.
Effect of Low Pressure on Surface Roughness and Morphological Defects of 4H-SiC Epitaxial Layers. Materials 2016, 9, 743.
https://doi.org/10.3390/ma9090743
AMA Style
Hu J, Jia R, Xin B, Peng B, Wang Y, Zhang Y.
Effect of Low Pressure on Surface Roughness and Morphological Defects of 4H-SiC Epitaxial Layers. Materials. 2016; 9(9):743.
https://doi.org/10.3390/ma9090743
Chicago/Turabian Style
Hu, Jichao, Renxu Jia, Bin Xin, Bo Peng, Yuehu Wang, and Yuming Zhang.
2016. "Effect of Low Pressure on Surface Roughness and Morphological Defects of 4H-SiC Epitaxial Layers" Materials 9, no. 9: 743.
https://doi.org/10.3390/ma9090743
APA Style
Hu, J., Jia, R., Xin, B., Peng, B., Wang, Y., & Zhang, Y.
(2016). Effect of Low Pressure on Surface Roughness and Morphological Defects of 4H-SiC Epitaxial Layers. Materials, 9(9), 743.
https://doi.org/10.3390/ma9090743