Innovative Tool for Improving Surface Quality in Single Point Incremental Forming: A Comparison with Hemispherical Tools
Abstract
1. Introduction
1.1. Single Point Incremental Forming
1.2. Literature Review
1.3. Objective and Importance of Our Study
2. Materials and Methods
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- A tool with a hemispherical head and an active zone radius of 10 mm, referred to as SS10 (Figure 4a).
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- A tool with a hemispherical head and an active zone radius of 5 mm, referred to as SS5 (Figure 4b).
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- An innovative tool featuring an eccentric head with a variable radius ranging from 5 to 10 mm, developed by the authors, referred to as ETVR (Figure 5).
- Flat punch: This tool enhances the material’s deformability by increasing the temperature at the contact area between the tool and the sheet due to intense friction in the flat area.
- Large-radius hemispherical punch (R = 10 mm): This punch positively affects surface quality, resulting in reduced roughness and increased productivity [43].
- Small-radius hemispherical punch (R = 5 mm): This punch also improves material deformability due to its smaller contact area.
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- The depth of the indentation (h) must be less than 1/10 of the thickness of the sample being studied. Since the smallest wall thickness of the formed part is approximately 0.6 mm (as measured with a micrometer), the indentation depth must not exceed 0.06 mm.
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- In the Vickers method, there is a relationship between the depth (h) and the diagonal (d) of the indentation, where h ≈ d/7. Given the maximum indentation depth of 0.06 mm, the maximum diagonal of the indentation should be no more than 0.42 mm.
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- Two different pressing loads were tested on the sheettype workpiece: 200 gf and 300 gf. For the 300gf load, diagonal values of approximately 0.06 mm were achieved, meeting the previous requirements. This load was established as preferable because it produces higher imprint diagonal values, facilitating measurement and enhancing the homogeneity of results.
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- A pressing load greater than 300 gf was not used, even though it was acceptable concerning the indentation depth. Employing a heavier load would have resulted in a length that would be too large to investigate in the specific areas of the cone generator (B, M, T) while maintaining the condition for the successive positioning of two imprints (l > 6d).
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- The arithmetic mean of the values (average value), denoted as Xm:
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- Standard deviation, denoted as s:
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- Relative Standard Deviation, denoted as RSD:
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- Margin of Error, denoted as ME:
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- X represents, as the case may be, roughness parameter Ra or Rt, or microhardness HV;
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- n represents the number of measurements in the analyzed sample;
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- α represents the significance level associated with the considered confidence level, of 95% (α = 0.05);
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- represents the number of degrees of freedom of the considered data sample.
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- If p < αaj, the null hypothesis is rejected, indicating that the differences between the two samples are statistically significant.
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- If p ≥ αaj, there is insufficient evidence to reject the null hypothesis, meaning the differences between the two samples are considered statistically insignificant.
3. Results
3.1. SPIF Microchips: Visual Appearance of Formed Surfaces
3.1.1. Microchips and Visual Appearance of Surfaces When Forming with the SS10 Tool
3.1.2. Microchips and Visual Appearance of Surfaces When Forming with the SS5 Tool
3.1.3. Microchips and Visual Appearance of Surfaces When Forming with the ETVR Tool
3.2. Surface Roughness of Parts Formed by SPIF
3.2.1. Surface Roughness of the Blank
3.2.2. Surface Roughness of Parts Formed with the SS10 Tool
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- The average values of the roughness parameters Ra and Rt on the formed part are higher than those of the workpiece in both analyzed directions, RD and TD. However, the roughness of the formed part is more consistent than that of the workpiece. This difference can be attributed to the SPIF process, which alters the surface asperities due to the direct contact between the tool and the workpiece. The increase in Ra indicates a specific texture created by the tool’s path. At the same time, the rise in Rt is the result of indentations caused by contact pressure, as well as isolated occurrences such as scratches, microadhesion, and microchips that reach the contact area between the tool and the workpiece.
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- The average values of the Ra parameter in the RD (rolling direction) are lower than those in the TD (transverse direction). The difference is more pronounced at the base of the cone, measuring approximately 0.064 μm, and smaller at the midpoint, around 0.027 μm. In contrast, the average values of the Rt parameter vary between the two directions; they are greater in the RD direction at the base of the cone, larger in the TD direction at the midpoint, and nearly equal at the tip of the cone. This variation suggests a stabilization of isolated events specific to the SPIF process.
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- The evolution of the Ra parameter along the cone generator is similar in both the RD and TD directions: it shows lower values at the base and higher values at the tip. In contrast, the evolution of the Rt parameter differs between the two directions; however, the highest values are consistently found at the tip of the cone. This behavior is influenced by the forming process, during which more microchips accumulate at the tip of the forming cone. These microchips also reach the contact area between the tool and the workpiece, leading to damage to the formed surface. The variations in the Rt parameter are less pronounced in the TD direction. This is because the pressure exerted by the tool and its friction with the workpiece tend to align the surface asperities in the direction of the tool’s movement, resulting in more uniform and relatively smooth traces in that direction.
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- The low values of the relative standard deviation (RSD < 6.383%) for the Ra parameter measured in the specific areas of interest (B, M, T) indicate that the measurements have good repeatability. In contrast, the higher relative standard deviation values for the Rt parameter (RSD = 14% to 26%) are expected, as this parameter is sensitive to extremes. Occasional extremes, such as scratches and asperities, can increase the dispersion of the values.
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- The Rt/Ra ratio shows the highest values at the base of the cone in the RD direction (10.098), while the lowest values are found in the middle of the cone (6.947), also in the RD direction. The elevated values at the cone’s base can be attributed to the lower Ra parameter and the presence of microbreaks and vibrations in the material, which are typical during the initial stages of forming. In the TD direction, the values of this ratio fall within a narrower range (8.121 to 9.011) due to the smaller variation of the Rt parameter in that direction.
3.2.3. Surface Roughness of Parts Formed with the SS5 Tool
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- The average roughness parameters Ra and Rt on the formed part are significantly higher than those of the blank in both analyzed directions: RD (radial direction) and TD (tangential direction). Specifically, the differences exceed 2.2 µm for the Ra parameter in the RD direction and over 1.9 µm in the TD direction. For the Rt parameter, the differences are even more pronounced, with increases of over 12.592 µm in the RD direction and over 11.181 µm in the TD direction. These substantial increases in roughness result from the limited contact area between the tool and the workpiece, leading to severe local plastic deformation and microchipping. Consequently, the surface asperities on the formed part are more pronounced, showing more accentuated tool marks and deeper scratches due to the abrasive contact with the tool.
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- As the deformation process advances, the average values of the Ra and Rt parameters increase more significantly in the TD (transverse direction) compared to the RD (rolling direction). The maximum differences are observed at the tip of the cone, with Ra measuring 0.29 µm and Rt measuring 4.467 µm. This change is attributed to the very high contact pressure of the tool over a limited contact area, which leads to a deterioration of the initial texture of the blank. Consequently, the roughness in the RD increases at a greater rate than that in the TD.
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- A critical increase in the values of the Ra and Rt parameters is observed from the base of the cone towards its tip, which is determined by the intensification of the deformation process and the accumulation of microchips in the toolworkpiece contact area. In the case of the Ra parameter, the increase is relatively uniform. In contrast, the increase in the Rt parameter occurs in the tip area of the cone, primarily due to the accumulation of large microchips in significant quantities towards the tip. Their penetration into the toolworkpiece contact area produces a large number of scratches on the part, which are much more visible.
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- The low values of the relative standard deviation (RSD < 4.68%) for the locally measured Ra parameter in the areas of interest (B, M, V) indicate good repeatability of the measurements. In contrast, the higher relative standard deviation values for the Rt parameter (RSD = 10.9% to 21.3%) are understandable, as the Rt parameter is highly sensitive to extreme values.
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- The Rt/Ra ratio exhibits higher values at the base of the cone and lower values in its middle section, in both the RD and TD directions. The maximum value recorded is 6.138 in the RD direction, while the minimum is 4.489, also in the RD direction. This variation in the Rt/Ra ratio can be attributed to the local high pressure exerted by the tool at the base of the cone, which hampers lubrication and leads to the formation of deep scratches. As a result, the Ra value increases moderately, while the Rt value rises significantly due to these scratches. In the middle section of the cone, the tool operates under more favorable conditions, resulting in better sliding and more uniform material deformation. Consequently, the Ra value increases (indicating a rougher surface), but the Rt value remains relatively unchanged. At the tip of the cone, working conditions deteriorate mainly due to the accumulation of microchips. The larger size of these chips results in deeper scratches, which causes an increase in the Rt parameter.
3.2.4. Surface Roughness of Parts Formed with the ETVR Tool
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- The average roughness parameters, Ra and Rt, of the formed part are higher than those of the blank in both the radial direction (RD) and tangential direction (TD). However, the roughness values of the formed part are more consistent compared to those of the blank, similar to the results obtained when using the SS10 tool. Specifically, the increases in the roughness parameters compared to the blank are more than 0.837 µm in the RD direction and over 0.472 µm in the TD direction for the Ra parameter. For the Rt parameter, the increases are greater than 5.622 µm in the RD direction and over 4.901 µm in the TD direction. These increases are larger than those observed with the SS10 tool, but significantly lower than those recorded with the SS5 tool.
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- The average values of the parameters Ra and Rt in the radial direction (RD) are higher than those in the transverse direction (TD) at both the base and the tip of the cone. The difference is more significant at the base, with Ra showing a difference of 0.66 μm and Rt showing a difference of 1.523 μm. However, in the middle of the cone, both roughness parameters are greater in the TD direction than in the RD direction, although the differences are relatively slight: 0.022 μm for Ra and 0.386 μm for Rt.
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- The evolution of the Ra parameter along the cone generator is similar to that from forming with the SS10 and SS5 tools, in both RD and TD directions: there are lower values at the base and higher values towards the tip. The increases in the Ra parameter values are monotonous and of the same intensity in the two directions, of 0.494 μm in the RD direction and 0.515 μm in the TD direction. In contrast, the evolution of the Rt parameter is different from that of forming with the other two tools, decreasing from the base of the cone towards its tip, in both directions, and with minimum values at its middle. This evolution, in which the higher values of Rt are higher at the base of the cone, can be explained as follows: at the beginning of the formation, the lubricant film can break locally, and the shape of the tool can favor this, through intermittent contact. Thus, the tool can generate extreme events, such as scratches and grooves, which result in higher values of Rt. The deformation process is better towards the middle area, when lubrication becomes better, and the number of microchips is not too high. It gets slightly worse towards the tip of the cone, with the increase in the number of microchips.
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- The low values of the relative standard deviation (RSD < 3.9%) for the Ra parameter measured locally in the areas of interest (B, M, V) indicate good repeatability of the measurements. In contrast, the higher relative standard deviation values for the Rt parameter (RSD = 14.019% to 31.59%) are still considered reasonable. This is because the Rt parameter is highly sensitive to extreme values.
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- The evolution of the Rt/Ra ratio values is similar to that observed when using hemispherical head tools. The highest Rt/Ra ratio is found at the base of the cone in the RD direction, measuring 9.932, while the lowest value occurs in the middle of the cone, at 5.242, also in the RD direction. The Rt/Ra ratio values from this method are slightly lower than those obtained using the SS10 tool, but higher than those achieved with the SS5 tool.
3.3. Microhardness of Parts Processed by SPIF
3.3.1. Microhardness of the Blank
3.3.2. Microhardness of the Surface Layer of Parts Formed with the SS10 Tool
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- The average microhardness values (HV 0.3) of the formed part are generally higher than those of the blank in both analyzed directions: radial (RD) and transverse (TD), as well as across the entire part. Near the base of the cone, the microhardness values are similar to those of the blank; however, they increase toward the tip of the cone in both directions (RD and TD). This indicates that the material of the formed part exhibits properties similar to the blank at the base, where the plastic deformation process begins, and becomes progressively harder toward the tip.
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- The average microhardness values (HV 0.3) in the TD direction are lower than those in the RD direction at both the middle and the tip of the cone. The maximum difference occurs at the middle of the cone’s generator, measuring approximately 9 HV 0.3. This suggests that, while the material’s anisotropy remains present, it is slightly reduced compared to the initial state of the workpiece in some areas of the generatrix cone.
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- The low relative standard deviation values (RDS < 4.6%) indicate that the measurements taken across all analyzed areas and in both directions show good repeatability.
3.3.3. Microhardness of the Surface Layer of Parts Formed with the SS5 Tool
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- The average microhardness values (HV0.3) of the formed parts are significantly higher than those of the blank, both in the radial direction (RD) and the transverse direction (TD) across the investigated areas (B, M, T). On average, microhardness increases by at least 38 HV0.3 in the RD and 53 HV0.3 in the TD. These increases indicate that the material of the formed part has undergone significant hardening due to the localized intensity of the plastic deformation process.
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- The differences in average microhardness values (HV0.3) between the RD and TD directions are minimal. At the base of the cone, the difference is 1.6 HV0.3, with higher values in the RD direction. In the middle of the cone, the difference is 2.3 HV0.3, with higher values in the TD direction. At the tip of the cone, the difference is 3.2 HV0.3, again with higher values in the TD direction. This suggests that the material’s anisotropy has been reduced compared to the initial state of the blank.
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- The average microhardness values (HV0.3) along the generator of the cone increase from the base to the tip, in both the RD and TD directions. This trend indicates that the hardening process intensifies as singlepass incremental forming (SPIF) progresses.
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- The very low relative standard deviation (RSD < 2.1%) reflects a high level of repeatability for the measurements taken in all analyzed areas and in both directions.
3.3.4. Microhardness of the Surface Layer of Parts Formed with the ETVR Tool
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- The average microhardness values (HV0.3) of the formed parts are consistently higher than those of the blank in both analyzed directions: Radial Direction (RD) and Tangential Direction (TD) across all zones of the cone generator (Base, Mid, Tip). On average, the microhardness increases by at least 14 HV0.3 for RD and 18 HV0.3 for TD. These increases demonstrate that the material of the formed part has hardened in all areas.
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- The differences in average microhardness values between the RD and TD directions become more pronounced from the base to the tip of the cone. Specifically, the differences are 3.3 HV0.3 at the base, 5.8 HV0.3 in the middle, and 15.2 HV0.3 at the tip, with consistently higher values found in the TD direction. This indicates a significant change in the material’s anisotropy compared to the original state of the blank, particularly demonstrating greater microhardness in the TD direction towards the tip of the cone.
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- Additionally, the average HV0.3 microhardness values along the cone generator increase from the base to the tip in both analyzed directions (RD and TD), suggesting that the hardening process intensifies as forming progresses.
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- Finally, the very low relative standard deviation (RSD < 4.2%) reflects a high level of repeatability in the measurements taken across all analyzed areas and in both directions.
4. Discussions
4.1. Analysis and Interpretation of Surface Roughness: A Comparative Study
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- The SS5 tool generated the most significant and most numerous microchips, measuring up to 83 μm. This larger chip size was associated with higher roughness values and a poorer visual appearance of the formed surface.
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- The SS10 tool produced significantly finer microchips, ranging from 7 to 18 μm, which resulted in a visually superior surface.
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- The ETVR tool generated the fewest microchips, predominantly of a fine size (8 μm), leading to a uniform aesthetic appearance of the formed surface and lower roughness.
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- The SS5 tool, which has the smallest radius, produced the highest roughness values, reaching up to 4.4 μm at the tip. It also exhibited the most significant variation in roughness between the base and the tip, measuring 1.84 μm.
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- The SS10 tool, featuring the largest radius, resulted in significantly lower roughness values, around 0.6 μm at the tip, and showed the most minor variation along the cone generator, only 0.13 μm.
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- The innovative ETVR tool, designed with an eccentric shape and variable radius, yielded intermediate results, with average roughness Ra values ranging from 0.94 to 1.44 μm. It also provided a uniform visual appearance of the surface.
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- The SS5 tool produced the highest Rt values, exceeding 25 μm in the tip area. This reflects the deep scratches and grooves caused by the abrasive contact between the tool and the workpiece, along with the accumulation of microchips.
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- The SS10 tool yielded moderate Rt values, approximately 5–5.5 μm. The measurements fluctuated across different areas, with a slight increase in Rt at the tip due to the buildup of microchips.
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- The innovative ETVR tool achieved intermediate Rt results, with an average value ranging from 7 to 9 μm. There was a decreasing trend from the base to the middle of the tool, followed by a slight increase at the tip.
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- The differences in roughness parameters between the SS10 and SS5 surfaces are statistically significant and substantial. The Cohen’s d values for these comparisons are extremely high, exceeding 21 for the Ra parameter and over 4.8 for the Rt parameter (in absolute terms). Additionally, the percentage effects are also considerable, exceeding 188%. This indicates that the tools being compared yield vastly different performances in terms of workpiece roughness. Specifically, the SS5 tool results in Ra values of the formed surface that are 4 to 6 times higher than those produced by the SS10 tool. Moreover, the SS5 tool produces Rt values greater than 25 µm, which is significantly above the approximately 5 µm values achieved by the SS10 tool.
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- The comparison between SS5 and ETVR reveals significant and substantial differences in the roughness parameters of the two surfaces. Although the Cohen’s d values are somewhat lower than in the previous comparison, they are still notable, exceeding 15 for the Ra parameter and over 2.5 for the Rt parameter (in absolute values). Additionally, the percent change effects are pretty significant, surpassing 63%. The two tools being compared demonstrate different performances regarding part roughness; however, the ETVR tool is not as effective as the SS10.
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- The comparison between ETVR and SS10 reveals that the differences in roughness parameters of the two surfaces are both statistically significant and substantial. The Cohen’s d values are the lowest of all comparisons made, with a value exceeding 10 for the Ra parameter and exceeding 1.5 for the Rt parameter (in absolute terms). While the percentage effects are smaller than in previous comparisons, they still exceed 45%. The two tools being compared exhibit different performances in terms of workpiece roughness for both roughness parameters.
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- When using the SS5 tool, the reduced active area focuses the deforming forces on a smaller volume of material. This concentration generates higher stresses, leading to the detachment of a larger number of microchips, which ultimately damages the surface layer.
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- In contrast, the SS10 tool, which has a larger contact area, distributes stresses more evenly. This even distribution reduces specific friction and prevents the accumulation of microchips. Additionally, the larger radius of the tool improves the overlap of the forming trajectory determined by the incremental step in the Z-axis direction.
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- The asymmetric geometry of the active area of the innovative ETVR tool, along with its varying radius (between that of the SS5 tool and the SS10 tool), creates nonuniform yet controlled friction with the workpiece. This design results in intermittent radial forming, promoting the selfcleaning of the surface and helping to eliminate fine chips, a mechanism that is rarely addressed in other research.
4.2. Microhardness of the Surface Layer: Trends and Justifications
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- Comparison of SS10 and SS5: The average hardness values are consistently higher for parts formed with SS5 compared to those formed with SS10. The percentage differences are 25.6% at the base, 23.14% at the middle, and 20.98% at the tip. The Cohen’s d value, in absolute terms, ranges from 7.35 to 10.71, which is the highest among the comparisons conducted. The SS5 tool, which has a smaller radius, results in a significantly greater hardening of the surface layer of the part. This is due to the concentration of force on a smaller surface area, which enhances the hardening effect.
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- In the comparison between SS5 and ETVR, the average HV values for the parts formed with SS5 are consistently higher than those formed with ETVR. However, the percentage differences are more minor than in the previous comparison, with differences of 13.1% at the base, 13.6% in the middle, and 10.06% at the top. The Cohen’s d values are lower than in the earlier comparison, ranging from 3.12 to 6.73. Nevertheless, the effects remain strong in this case as well.
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- The comparison between the parts formed with ETVR and SS10 tools shows significant differences (p << 0.001). Using the ETVR tool results in higher hardness values of the formed surface compared to the SS10 tool. The percentage differences are 11.04% at the base, 8.39% in the middle, and 9.92% at the tip. Cohen’s d values range from 2.42 to 4.33, indicating large to considerable effects in this case. These differences can be attributed to the geometric shape of the ETVR tool, which, due to its eccentricity and variable, intermittent contact, produces more intense work hardening compared to the 10 mm radius tool (SS10) but less than the 5 mm radius tool (SS5).
4.3. The Impact of Material Anisotropy on Surface Roughness and Microhardness
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- The initial topography of the sheet features asperities that are oriented linearly along the RD. When deformation occurs parallel to the RD, these asperities tend to flatten and align with the tool’s feed direction, resulting in a smoother surface.
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- In the TD direction, the tool intersects the laminated asperities, leading to a more disruptive mechanical interaction characterized by increased friction. This interaction can cause the formation of larger microchips and an increase in surface roughness.
4.4. Integrated Analysis: Balancing Surface Roughness and Microhardness
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- The graph in Figure 41 shows a clear trend: as the microhardness (HV) increases, the average roughness (Ra) also tends to grow in a roughly linear fashion. This indicates that the more pronounced asperities on the formed surface (higher Ra) are associated with greater deformation of the material in the surface layer of the part. This phenomenon is linked to grain deformation and an increase in microhardness.
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- The graph in Figure 42 indicates that the roughness parameter Rt tends to increase with the rise in microhardness HV. However, this relationship is not linear for parts formed using the SS5 tool. This can be attributed to the appearance of deep scratches during the forming process with the SS5 tool, which do not necessarily result in hardening. As a result, the increase in HV is not proportional to the increase in Rt.
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- The Rt parameter focuses on the extremes of the surface profile and is sensitive to isolated defects, which do not accurately reflect the uniformity of the deformation process. Therefore, it is considered that the correlation between Ra and HV is more reliable than that between Rt and HV.
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- SPIF forming with the SS10 tool leads to obtaining smooth and uniform surfaces, but produces moderate hardening of the material.
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- SPIF forming with the SS5 tool leads to obtaining rough surfaces, with possible extreme defects, but with intense hardening of the material.
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- SPIF forming with the ETVR tool leads to obtaining surfaces that present a compromise between surface quality and material hardening.
5. Conclusions
- The tool with the smallerradius hemispherical head (SS5) resulted in the highest surface roughness values. This is due to increased contact and the accumulation of microchips in the deformation zone. However, it also caused the most significant work hardening, which is a result of more intense localized plastic deformation.
- The tool with the largerradius hemispherical head (SS10) produced the best surface finish due to its increased contact area and overlapping tool paths, but it also led to the least amount of work hardening.
- The innovative ETVR tool demonstrated impressive performance by producing a low surface roughness, attaining high and uniform microhardness, and effectively accommodating complex deformations, especially in the cone tip region. As a result, this tool serves as a viable alternative to conventional hemispherical tools, providing clear advantages for industrial applications.
- Material anisotropy, which refers to the differences between the rolling direction (RD) and transverse direction (TD), significantly affected both surface roughness and microhardness. In some cases, reversals between these directions were observed, which can be explained by the part geometry, tool path direction, and local stress accumulations.
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- Evaluating the performance of the innovative tool on different materials with varying ductility, such as aluminum alloys AA7075 and AA1050;
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- Analyzing the tool’s performance under different technological parameters (such as tool speed, feed rate, and incremental step) to differentiate the effects of tool geometry from any potential synergies with these parameters.
Author Contributions
Funding
Institutional Review Board Statement
Informed Consent Statement
Data Availability Statement
Conflicts of Interest
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Chemical Element | Si | Cu | Mg | Cr | Fe | Mn | Zn | Ti | Other | Al |
---|---|---|---|---|---|---|---|---|---|---|
Effective values (wt%) | 1.52 | 0.38 | 1.59 | 0.27 | 0.65 | 0.19 | 0.1 | 0.04 | 1.05 | 94.21 |
Measurement error (%) | 0.010 | 0.001 | 0.012 | 0.003 | 0.003 | 0.002 | 0.001 | 0.005 | - | 0.08 |
Mechanical Property | Value According to UNS A96061 [40] | Effective Value, in a Direction at 45° to RD |
---|---|---|
Tensile strength, Rm [MPa] | 310 | 329.77 |
Yield strength, Rp0.2 [MPa] | 276 | 282.65 |
Elongation, At [%] | 12–17 | 13.85 |
Poisson’s ratio, ν [-] | 0.33 | 0.33 |
Modulus of elasticity, E [GPa] | 68.9 | 64.83 |
Piece | Ra (μm) | λc (mm) | N (Cut-Off nb.) | Lt (mm) | v (mm/s) | F (mN) |
---|---|---|---|---|---|---|
Blank | 0.1–0.2 | 0.8 | 4 | 3.2 | 0.25 | 0.75 |
SS10 | ||||||
ETVR | ||||||
SS5 | 2.0–10.0 | 2.5 | 1 | 2.5 |
Tool | Technological Parameter | Rolling Direction | Transverse Direction | ||||
---|---|---|---|---|---|---|---|
n (rot/min) | v (mm/min) | Δz (mm) | E2 | E4 | E1 | E3 | |
SS10 | 2000 | 1000 | 0.3 | Areas: Base, Middle, Tip 5 measurements in each area | |||
SS5 | |||||||
ETVR |
Direction | Average Ra (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|
RD | 0.115 | 0.005 | 4.416 | 0.006 |
TD | 0.454 | 0.012 | 2.776 | 0.016 |
Blank average | 0.284 | 0.178 | 59.632 | 0.128 |
Direction | Average Rt (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|
RD | 1.381 | 0.349 | 25.264 | 0.430 |
TD | 2.488 | 0.116 | 4.649 | 0.140 |
Blank average | 1.900 | 0.633 | 33.297 | 0.450 |
Direction | Area | Average Ra (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 0.500 | 0.020 | 4.050 | 0.014 |
Middle | 0.599 | 0.026 | 4.464 | 0.019 | |
Tip | 0.641 | 0.025 | 3.929 | 0.018 | |
TD average (E1 and E3) | Base | 0.564 | 0.026 | 4.768 | 0.019 |
Middle | 0.626 | 0.040 | 6.383 | 0.029 | |
Tip | 0.678 | 0.035 | 5.178 | 0.025 | |
Piece average (E1–E4) | Base | 0.532 | 0.040 | 7.514 | 0.019 |
Middle | 0.613 | 0.036 | 5.868 | 0.017 | |
Tip | 0.660 | 0.035 | 5.370 | 0.017 |
Sample | Area | Average Rt (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 5.049 | 1.036 | 20.527 | 0.741 |
Middle | 4.161 | 0.563 | 13.542 | 0.403 | |
Tip | 5.471 | 0.919 | 16.795 | 0.657 | |
TD average (E1 and E3) | Base | 4.793 | 1.214 | 25.324 | 0.868 |
Middle | 5.641 | 0.998 | 17.685 | 0.714 | |
Tip | 5.506 | 0.784 | 14.235 | 0.561 | |
Piece average (E1–E4) | Base | 4.921 | 1.106 | 22.482 | 0.518 |
Middle | 4.901 | 1.095 | 22.335 | 0.512 | |
Tip | 5.489 | 0.831 | 15.147 | 0.389 |
Area | RD (Average) | TD (Average) | Piece (Average) |
---|---|---|---|
Base | 10.098 | 8.498 | 9.250 |
Middle | 6.947 | 9.011 | 7.995 |
Tip | 8.535 | 8.121 | 8.317 |
Sample | Area | Average Ra (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 2.335 | 0.109 | 4.680 | 0.078 |
Middle | 3.299 | 0.091 | 2.772 | 0.065 | |
Tip | 4.339 | 0.137 | 3.165 | 0.098 | |
TD average (E1 and E3) | Base | 2.357 | 0.066 | 2.826 | 0.048 |
Middle | 3.044 | 0.104 | 3.424 | 0.075 | |
Tip | 4.049 | 0.130 | 3.209 | 0.093 | |
Piece average (E1–E4) | Base | 2.346 | 0.088 | 3.784 | 0.042 |
Middle | 3.172 | 0.161 | 5.102 | 0.076 | |
Tip | 4.194 | 0.197 | 4.716 | 0.093 |
Sample | Area | Average Rt (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 14.332 | 3.048 | 21.265 | 2.180 |
Middle | 14.808 | 1.894 | 12.790 | 1.355 | |
Tip | 25.852 | 4.293 | 16.605 | 3.071 | |
TD average (E1 and E3) | Base | 14.093 | 1.963 | 13.930 | 1.404 |
Middle | 13.669 | 1.491 | 10.911 | 1.067 | |
Tip | 21.205 | 4.502 | 21.231 | 3.221 | |
Piece average (E1–E4) | Base | 14.213 | 2.498 | 17.576 | 1.169 |
Middle | 14.239 | 1.759 | 12.354 | 0.823 | |
Tip | 23.529 | 4.900 | 20.826 | 2.293 |
Area | RD (Average) | TD (Average) | Piece (Average) |
---|---|---|---|
Base | 6.138 | 5.979 | 6.058 |
Middle | 4.489 | 4.490 | 4.489 |
Tip | 5.958 | 5.237 | 5.610 |
Sample | Area | Average Ra (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 0.952 | 0.035 | 3.706 | 0.025 |
Middle | 1.336 | 0.050 | 3.748 | 0.036 | |
Tip | 1.446 | 0.049 | 3.433 | 0.036 | |
TD average (E1 and E3) | Base | 0.926 | 0.036 | 3.891 | 0.026 |
Middle | 1.358 | 0.031 | 2.319 | 0.023 | |
Tip | 1.441 | 0.050 | 3.503 | 0.036 | |
Piece average (E1–E4) | Base | 0.939 | 0.0371 | 3.960 | 0.017 |
Middle | 1.347 | 0.042 | 3.146 | 0.020 | |
Tip | 1.444 | 0.048 | 3.381 | 0.023 |
Sample | Area | Average Rt (μm) | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 9.455 | 1.992 | 21.073 | 1.425 |
Middle | 7.003 | 1.929 | 27.548 | 1.380 | |
Tip | 8.052 | 2.543 | 31.583 | 1.819 | |
TD average (E1 and E3) | Base | 7.932 | 1.118 | 14.092 | 0.800 |
Middle | 7.389 | 2.195 | 29.707 | 1.570 | |
Tip | 7.888 | 1.473 | 18.678 | 1.054 | |
Piece average (E1–E4) | Base | 8.694 | 1.756 | 20.195 | 0.822 |
Middle | 7.196 | 2.021 | 28.086 | 0.946 | |
Tip | 7.970 | 2.025 | 25.402 | 0.947 |
Area | RD (Average) | TD (Average) | Piece (Average) |
---|---|---|---|
Base | 9.932 | 8.566 | 9.259 |
Middle | 5.242 | 5.441 | 5.342 |
Tip | 5.568 | 5.474 | 5.519 |
Direction | Average HV 0.3 | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|
RD | 158.58 | 1.427 | 0.900 | 1.77 |
TD | 142.24 | 1.906 | 1.340 | 2.37 |
Blank average | 150.4 | 8.757 | 5.822 | 6.26 |
Sample | Area | Average HV 0.3 | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 156.8 | 5.545 | 3.536 | 3.97 |
Middle | 175.9 | 5.087 | 2.892 | 3.64 | |
Tip | 180.9 | 8.280 | 4.577 | 5.92 | |
TD average (E1 and E3) | Base | 158 | 2.794 | 1.768 | 2.00 |
Middle | 167.3 | 4.244 | 2.537 | 3.04 | |
Tip | 177.3 | 2.897 | 1.634 | 2.07 | |
Piece average (E1–E4) | Base | 157.4 | 4.316 | 2.742 | 2.02 |
Middle | 171.6 | 6.323 | 3.685 | 2.96 | |
Tip | 179.1 | 6.321 | 3.529 | 2.96 |
Sample | Area | Average HV 0.3 | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 198.5 | 2.506 | 1.262 | 1.79 |
Middle | 210.2 | 2.919 | 1.388 | 2.09 | |
Tip | 215.1 | 2.894 | 1.345 | 2.07 | |
TD average (E1 and E3) | Base | 196.9 | 3.581 | 1.819 | 2.56 |
Middle | 212.5 | 2.784 | 1.310 | 1.99 | |
Tip | 218.3 | 3.394 | 1.554 | 2.43 | |
Piece average (E1–E4) | Base | 197.7 | 3.113 | 1.574 | 1.46 |
Middle | 211.4 | 3.027 | 1.431 | 1.42 | |
Tip | 216.7 | 3.498 | 1.614 | 1.64 |
Sample | Area | Average HV 0.3 | Standard Deviation | RSD (%) | Margin of Error |
---|---|---|---|---|---|
RD average (E2 and E4) | Base | 173.1 | 2.656 | 1.534 | 1.90 |
Middle | 183.1 | 2.692 | 1.470 | 1.93 | |
Tip | 189.3 | 2.846 | 1.503 | 2.04 | |
TD average (E1 and E3) | Base | 176.4 | 3.927 | 2.226 | 2.81 |
Middle | 188.9 | 3.998 | 2.116 | 2.86 | |
Tip | 204.5 | 2.838 | 1.388 | 2.03 | |
Piece average (E1–E4) | Base | 174.8 | 3.674 | 2.101 | 1.72 |
Middle | 186 | 4.466 | 2.401 | 2.09 | |
Tip | 196.9 | 8.254 | 4.192 | 3.86 |
Tool | Microchip Size [μm] | Roughness Limits [μm] | ||
---|---|---|---|---|
Limits | Average | Ra | Rt | |
SS10 | 7–18 | 12 | 0.500–0.678 | 4.161–5.641 |
SS5 | 21–83 | 45 | 2.335–4.339 | 13.669–25.852 |
ETVR | 2–51 | 8 | 0.926–1.446 | 7.003–9.455 |
Tested Sample | Area | n | Xm | s | s2 | p-Value | Cohen’s d | Δ% | |
---|---|---|---|---|---|---|---|---|---|
SS10–SS5 | Base | 20 | 0.532 | 0.040 | 0.002 | 0.203 | 1.68 × 10−33 | −26.35 | 341.17 |
20 | 2.346 | 0.089 | 0.008 | ||||||
Middle | 20 | 0.613 | 0.036 | 0.001 | 0.049 | 4.02 × 10−26 | −21.83 | 417.65 | |
20 | 3.171 | 0.162 | 0.026 | ||||||
Tip | 20 | 0.659 | 0.035 | 0.001 | 0.032 | 1.26 × 10−26 | −24.88 | 536.06 | |
20 | 4.194 | 0.198 | 0.039 | ||||||
SS5–ETVR | Base | 20 | 2.346 | 0.089 | 0.008 | 5.701 | 6.89 × 10−30 | 20.66 | 149.72 |
20 | 0.939 | 0.037 | 0.001 | ||||||
Middle | 20 | 3.171 | 0.162 | 0.026 | 14.581 | 1.39 × 10−23 | 15.42 | 135.45 | |
20 | 1.347 | 0.042 | 0.002 | ||||||
Tip | 20 | 4.194 | 0.198 | 0.039 | 16.415 | 2.6 × 10−25 | 19.09 | 190.58 | |
20 | 1.443 | 0.049 | 0.002 | ||||||
ETVR–SS10 | Base | 20 | 0.939 | 0.037 | 0.001 | 0.865 | 9.06 × 10−30 | 10.56 | 76.66 |
20 | 0.532 | 0.040 | 0.002 | ||||||
Middle | 20 | 1.347 | 0.042 | 0.002 | 1.388 | 5.32 × 10−39 | 18.68 | 119.86 | |
20 | 0.613 | 0.036 | 0.001 | ||||||
Tip | 20 | 1.443 | 0.049 | 0.002 | 1.897 | 9.84 × 10−39 | 18.38 | 118.90 | |
20 | 0.659 | 0.035 | 0.001 |
Tested Sample | Area | n | Xm | s | s2 | p-Value | Cohen’s d | Δ% | |
---|---|---|---|---|---|---|---|---|---|
SS10–SS5 | Base | 20 | 4.921 | 1.106 | 1.224 | 0.196 | 1.64 × 10−14 | −4.81 | 188.82 |
20 | 14.213 | 2.498 | 6.240 | ||||||
Middle | 20 | 4.901 | 1.095 | 1.198 | 0.387 | 6.89 × 10−22 | −6.37 | 190.54 | |
20 | 14.239 | 1.759 | 3.094 | ||||||
Tip | 20 | 5.488 | 0.831 | 0.691 | 0.029 | 5.12 × 10−13 | −5.13 | 328.70 | |
20 | 23.529 | 4.900 | 24.012 | ||||||
SS5–ETVR | Base | 20 | 14.213 | 2.498 | 6.240 | 2.024 | 8.83 × 10−10 | 2.56 | 63.49 |
20 | 8.693 | 1.756 | 3.083 | ||||||
Middle | 20 | 14.239 | 1.759 | 3.094 | 0.758 | 3.17 × 10−14 | 3.72 | 97.88 | |
20 | 7.196 | 2.021 | 4.085 | ||||||
Tip | 20 | 23.529 | 4.900 | 24.012 | 5.859 | 8.56 × 10−13 | 4.15 | 195.22 | |
20 | 7.970 | 2.025 | 4.099 | ||||||
ETVR–SS10 | Base | 20 | 8.693 | 1.756 | 3.083 | 2.519 | 7.73 × 10−10 | 2.57 | 76.65 |
20 | 4.921 | 1.106 | 1.224 | ||||||
Middle | 20 | 7.196 | 2.021 | 4.085 | 3.409 | 1.10 × 10−5 | 1.41 | 46.83 | |
20 | 4.901 | 1.095 | 1.198 | ||||||
Tip | 20 | 7.970 | 2.025 | 4.099 | 5.929 | 3.03 × 10−5 | 1.60 | 45.21 | |
20 | 5.488 | 0.831 | 0.691 |
Tested Sample | Area | n | Xm | s | s2 | p-Value | Cohen’s d | Δ% | |
---|---|---|---|---|---|---|---|---|---|
SS10–SS5 | Base | 20 | 157.390 | 4.317 | 18.633 | 1.922 | 5.45 × 10−30 | −10.71 | 25.60 |
20 | 197.680 | 3.113 | 9.693 | ||||||
Middle | 20 | 171.610 | 6.323 | 39.986 | 4.364 | 1.72 × 10−20 | −8.01 | 23.14 | |
20 | 211.325 | 3.027 | 9.163 | ||||||
Tip | 20 | 179.115 | 6.321 | 39.959 | 3.265 | 1.37 × 10−20 | −7.35 | 20.98 | |
20 | 216.685 | 3.498 | 12.239 | ||||||
SS5–ETVR | Base | 20 | 197.680 | 3.113 | 9.693 | 0.718 | 1.03 × 10−22 | 6.73 | 13.11 |
20 | 174.765 | 3.674 | 13.499 | ||||||
Middle | 20 | 211.325 | 3.027 | 9.163 | 0.459 | 1.68 × 10−22 | 6.64 | 13.61 | |
20 | 186.005 | 4.467 | 19.952 | ||||||
Tip | 20 | 216.685 | 3.498 | 12.239 | 0.180 | 3.18 × 10−10 | 3.12 | 10.06 | |
20 | 196.880 | 8.254 | 68.136 | ||||||
ETVR–SS10 | Base | 20 | 174.765 | 3.674 | 13.499 | 0.724 | 2.74 × 10−16 | 4.33 | 11.04 |
20 | 157.390 | 4.317 | 18.633 | ||||||
Middle | 20 | 186.005 | 4.467 | 19.952 | 0.499 | 4.42 × 10−10 | 2.63 | 8.39 | |
20 | 171.610 | 6.323 | 39.986 | ||||||
Tip | 20 | 196.880 | 8.254 | 68.136 | 1.705 | 3.39 × 10−9 | 2.42 | 9.92 | |
20 | 179.115 | 6.321 | 39.959 |
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Bădulescu, E.; Niţu, E.L.; Iordache, D.M.; Bădulescu, C. Innovative Tool for Improving Surface Quality in Single Point Incremental Forming: A Comparison with Hemispherical Tools. Materials 2025, 18, 4275. https://doi.org/10.3390/ma18184275
Bădulescu E, Niţu EL, Iordache DM, Bădulescu C. Innovative Tool for Improving Surface Quality in Single Point Incremental Forming: A Comparison with Hemispherical Tools. Materials. 2025; 18(18):4275. https://doi.org/10.3390/ma18184275
Chicago/Turabian StyleBădulescu, Emanuel, Eduard Laurenţiu Niţu, Daniela Monica Iordache, and Claudiu Bădulescu. 2025. "Innovative Tool for Improving Surface Quality in Single Point Incremental Forming: A Comparison with Hemispherical Tools" Materials 18, no. 18: 4275. https://doi.org/10.3390/ma18184275
APA StyleBădulescu, E., Niţu, E. L., Iordache, D. M., & Bădulescu, C. (2025). Innovative Tool for Improving Surface Quality in Single Point Incremental Forming: A Comparison with Hemispherical Tools. Materials, 18(18), 4275. https://doi.org/10.3390/ma18184275