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Journal: Materials, 2024
Volume: 17
Number: 4048
4048
Article: Real-Time Spectroscopic Ellipsometry for Flux Calibrations in Multi-Source Co-Evaporation of Thin Films: Application to Rate Variations in CuInSe₂ Deposition
Authors: by Dhurba R. Sapkota, Balaji Ramanujam, Puja Pradhan, Mohammed A. Razooqi Alaani, Ambalanath Shan, Michael J. Heben, Sylvain Marsillac, Nikolas J. Podraza and Robert W. Collins
Link: https://www.mdpi.com/1996-1944/17/16/4048

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