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Journal: Materials, 2023
Volume: 16
Number: 3347
Article:
Boron-Related Defects in N-Type 4H-SiC Schottky Barrier Diodes
Authors:
by
Tihomir Knezevic, Eva Jelavić, Yuichi Yamazaki, Takeshi Ohshima, Takahiro Makino and Ivana Capan
Link:
https://www.mdpi.com/1996-1944/16/9/3347
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