Order Article Reprints

Liao R-Y, Chen H-H, Lin P-Y, Liang T-A, Su K-H, Lin I-C, Wen C-H, Chou W-C, Hsu H-H, Cheng C-H. Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials. 2023; 16(9):3306. https://doi.org/10.3390/ma16093306

Liao, Ruo-Yin, Hsuan-Han Chen, Ping-Yu Lin, Ting-An Liang, Kuan-Hung Su, I-Cheng Lin, Chen-Hao Wen, Wu-Ching Chou, Hsiao-Hsuan Hsu, and Chun-Hu Cheng. 2023. "Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices" Materials 16, no. 9: 3306. https://doi.org/10.3390/ma16093306

Liao, R.-Y., Chen, H.-H., Lin, P.-Y., Liang, T.-A., Su, K.-H., Lin, I.-C., Wen, C.-H., Chou, W.-C., Hsu, H.-H., & Cheng, C.-H. (2023). Ferroelectricity and Oxide Reliability of Stacked Hafnium–Zirconium Oxide Devices. Materials, 16(9), 3306. https://doi.org/10.3390/ma16093306