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Journal: Materials, 2023
Volume: 16
Number: 2282
Article:
Charge Trapping and Emission Properties in CAAC-IGZO Transistor: A First-Principles Calculations
Authors:
by
Ziqi Wang, Nianduan Lu, Jiawei Wang, Di Geng, Lingfei Wang and Guanhua Yang
Link:
https://www.mdpi.com/1996-1944/16/6/2282
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