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Journal: Materials, 2023
Volume: 16
Number: 681

Article: Testing and Analysis Method of Low Remanence Materials for Magnetic Shielding Device
Authors: by Yuan Cheng, Yaozhi Luo, Ruihong Shen, Deyu Kong and Weiyong Zhou
Link: https://www.mdpi.com/1996-1944/16/2/681

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