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Journal: Materials, 2022
Volume: 15
Number: 830

Article: Structural and Insulating Behaviour of High-Permittivity Binary Oxide Thin Films for Silicon Carbide and Gallium Nitride Electronic Devices
Authors: by Raffaella Lo Nigro, Patrick Fiorenza, Giuseppe Greco, Emanuela Schilirò and Fabrizio Roccaforte
Link: https://www.mdpi.com/1996-1944/15/3/830

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