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Journal: Materials, 2022
Volume: 15
Number: 830
Article:
Structural and Insulating Behaviour of High-Permittivity Binary Oxide Thin Films for Silicon Carbide and Gallium Nitride Electronic Devices
Authors:
by
Raffaella Lo Nigro, Patrick Fiorenza, Giuseppe Greco, Emanuela Schilirò and Fabrizio Roccaforte
Link:
https://www.mdpi.com/1996-1944/15/3/830
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