Yang, X.; Zhang, D.; Wu, B.; Zhang, K.; Yang, B.; Wang, Z.; Wu, X.
Accurate Characterization of the Adhesive Layer Thickness of Ceramic Bonding Structures Using Terahertz Time-Domain Spectroscopy. Materials 2022, 15, 6972.
https://doi.org/10.3390/ma15196972
AMA Style
Yang X, Zhang D, Wu B, Zhang K, Yang B, Wang Z, Wu X.
Accurate Characterization of the Adhesive Layer Thickness of Ceramic Bonding Structures Using Terahertz Time-Domain Spectroscopy. Materials. 2022; 15(19):6972.
https://doi.org/10.3390/ma15196972
Chicago/Turabian Style
Yang, Xiuwei, Dehai Zhang, Biyuan Wu, Kaihua Zhang, Bing Yang, Zhongmin Wang, and Xiaohu Wu.
2022. "Accurate Characterization of the Adhesive Layer Thickness of Ceramic Bonding Structures Using Terahertz Time-Domain Spectroscopy" Materials 15, no. 19: 6972.
https://doi.org/10.3390/ma15196972
APA Style
Yang, X., Zhang, D., Wu, B., Zhang, K., Yang, B., Wang, Z., & Wu, X.
(2022). Accurate Characterization of the Adhesive Layer Thickness of Ceramic Bonding Structures Using Terahertz Time-Domain Spectroscopy. Materials, 15(19), 6972.
https://doi.org/10.3390/ma15196972