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Journal: Materials, 2022
Volume: 15
Number: 6924
Article:
OFF-State Leakage Suppression in Vertical Electron–Hole Bilayer TFET Using Dual-Metal Left-Gate and N+-Pocket
Authors:
by
Hu Liu, Wenting Zhang, Zaixing Wang, Yao Li and Huawei Zhang
Link:
https://www.mdpi.com/1996-1944/15/19/6924
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