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Enhanced Switching Reliability of Sol–Gel-Processed Y2O3 RRAM Devices Based on Y2O3 Surface Roughness-Induced Local Electric Field
 
 

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Journal: Materials, 2022
Volume: 15
Number: 6859

Article: Improved Environment Stability of Y2O3 RRAM Devices with Au Passivated Ag Top Electrodes
Authors: by Hae-In Kim, Taehun Lee, Won-Yong Lee, Kyoungdu Kim, Jin-Hyuk Bae, In-Man Kang, Sin-Hyung Lee, Kwangeun Kim and Jaewon Jang
Link: https://www.mdpi.com/1996-1944/15/19/6859

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