Article Versions Notes

Kim H-I, Lee T, Lee W-Y, Kim K, Bae J-H, Kang I-M, Lee S-H, Kim K, Jang J. Improved Environment Stability of Y₂O₃ RRAM Devices with Au Passivated Ag Top Electrodes. Materials. 2022; 15(19):6859. https://doi.org/10.3390/ma15196859

Kim, Hae-In, Taehun Lee, Won-Yong Lee, Kyoungdu Kim, Jin-Hyuk Bae, In-Man Kang, Sin-Hyung Lee, Kwangeun Kim, and Jaewon Jang. 2022. "Improved Environment Stability of Y₂O₃ RRAM Devices with Au Passivated Ag Top Electrodes" Materials 15, no. 19: 6859. https://doi.org/10.3390/ma15196859

Kim, H.-I., Lee, T., Lee, W.-Y., Kim, K., Bae, J.-H., Kang, I.-M., Lee, S.-H., Kim, K., & Jang, J. (2022). Improved Environment Stability of Y₂O₃ RRAM Devices with Au Passivated Ag Top Electrodes. Materials, 15(19), 6859. https://doi.org/10.3390/ma15196859