Jeong, G.S.; Jung, Y.-C.; Park, N.Y.; Yu, Y.-J.; Lee, J.H.; Seo, J.H.; Choi, J.-Y.
Stoichiometry and Morphology Analysis of Thermally Deposited V2O5−x Thin Films for Si/V2O5−x Heterojunction Solar Cell Applications. Materials 2022, 15, 5243.
https://doi.org/10.3390/ma15155243
AMA Style
Jeong GS, Jung Y-C, Park NY, Yu Y-J, Lee JH, Seo JH, Choi J-Y.
Stoichiometry and Morphology Analysis of Thermally Deposited V2O5−x Thin Films for Si/V2O5−x Heterojunction Solar Cell Applications. Materials. 2022; 15(15):5243.
https://doi.org/10.3390/ma15155243
Chicago/Turabian Style
Jeong, Gwan Seung, Yoon-Chae Jung, Na Yeon Park, Young-Jin Yu, Jin Hee Lee, Jung Hwa Seo, and Jea-Young Choi.
2022. "Stoichiometry and Morphology Analysis of Thermally Deposited V2O5−x Thin Films for Si/V2O5−x Heterojunction Solar Cell Applications" Materials 15, no. 15: 5243.
https://doi.org/10.3390/ma15155243
APA Style
Jeong, G. S., Jung, Y.-C., Park, N. Y., Yu, Y.-J., Lee, J. H., Seo, J. H., & Choi, J.-Y.
(2022). Stoichiometry and Morphology Analysis of Thermally Deposited V2O5−x Thin Films for Si/V2O5−x Heterojunction Solar Cell Applications. Materials, 15(15), 5243.
https://doi.org/10.3390/ma15155243