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Journal: Materials, 2022
Volume: 15
Number: 3818
3818
Article: Electrical and Thermal Characteristics of AlGaN/GaN HEMT Devices with Dual Metal Gate Structure: A Theoretical Investigation
Authors: by Yongfeng Qu, Ningkang Deng, Yuan Yuan, Wenbo Hu, Hongxia Liu, Shengli Wu and Hongxing Wang
Link: https://www.mdpi.com/1996-1944/15/11/3818

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