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Journal: Materials, 2021
Volume: 14
Number: 578
578
Article: Spectroscopic Ellipsometry Characterization of As-Deposited and Annealed Non-Stoichiometric Indium Zinc Tin Oxide Thin Film
Authors: by Petr Janicek, Maryane Putri, Ki Hwan Kim, Hye Ji Lee, Marek Bouska, Stanislav Šlang and Hee Young Lee
Link: https://www.mdpi.com/1996-1944/14/3/578

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