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Journal: Materials, 2021
Volume: 14
Number: 4500

Article: Structural Insights of Electrical Aging in PZT Thin Films as Revealed by In Situ Biasing X-ray Diffraction
Authors: by Kien Nguyen, Ewen Bellec, Edoardo Zatterin, Gwenael Le Rhun, Patrice Gergaud and Nicolas Vaxelaire
Link: https://www.mdpi.com/1996-1944/14/16/4500

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