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Journal: Materials, 2020
Volume: 13
Number: 1408

Article: Electron Concentration Limit in Ge Doped by Ion Implantation and Flash Lamp Annealing
Authors: by Slawomir Prucnal, Jerzy Żuk, René Hübner, Juanmei Duan, Mao Wang, Krzysztof Pyszniak, Andrzej Drozdziel, Marcin Turek and Shengqiang Zhou
Link: https://www.mdpi.com/1996-1944/13/6/1408

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