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Journal: Materials, 2020
Volume: 13
Number: 5684

Article: Study of Radiation-Induced Defects in p-Type Si1−xGex Diodes before and after Annealing
Authors: by Tomas Ceponis, Stanislau Lastovskii, Leonid Makarenko, Jevgenij Pavlov, Kornelijus Pukas and Eugenijus Gaubas
Link: https://www.mdpi.com/1996-1944/13/24/5684

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